Vote for the Best in Test 2012
Our editors have selected the finalists for the Best in Test awards and the Test of Time award. Now, it's your turn to vote for the winners.
Test & Measurement World's editors have searched through many commendable products, nominated by vendors, that were introduced between November 1, 2010, and September 30, 2011. Below, we present the finalists for the 2012 Best in Test awards.
Please help us choose the winner: Vote for your favorite in each category below. To read about the finalists in each category and access the ballot for that category, click the category name.
We will announce the category winners at our Best in Test event, which will be held on January 31 in conjunction with DesignCon 2012; we will also announce them in our March 2012 issue. During our awards event, we will present the the 2012 Test Product of the Year award to the product that receives the most overall votes.
We have also selected the finalists for the Test of Time award, which honors a product that continues to provide state-of-the-art service five years or more after its introduction. Help us decide the 2012 Test of Time winner by going to tot.tmworld.com/finalists and voting for the product of your choice.
Voting deadline is December 16, 2011.
2012 Finalists
- Enhanced Performance Package for the T2000 SOC Platform
- GX3700/GX3700e PXI FPGA Modules
- High Speed Subsystem
- Multimedia Test Platform
- RFEM
- TestStation PXI Expansion Board
- Beagle USB 5000 SuperSpeed Protocol Analyzer
- Komodo CAN Duo Interface
- U4154A AXIe-based Logic Analyzer Module
- CP248 Isolated Bridge Conditioner
- DT9862 USB Data-Acquisition Module
- SP5600B Kit
- USB-2408 Series
- AutoBuzz Boundary-Scan Tool
- JT2147/DAK Boundary-Scan Interface
- ScanWorks BST in Teradyne Di-Series Instruments
- ScanWorks FPGA-Controlled Test
- SFX-TAP16/G TAP Transceiver
- ChipVORX Software
- ScanWorks High-Speed I/O for Intel Architecture
- ScanWorks IJTAG-DL
- TR5001T Tiny ICT
- ValidationAssistant
- GSG-55 16-Channel GPS Simulator
- Medalist i1000D In-Circuit Test System with Functional Test Suite
- TOSCA Testsuite
- TS-8900 Automotive Electronics Functional Test Solution
- MD8475A Mobile Device Tester
- ME7834 Mobile Device Test Platform
- Signaling Analyzer Real Time
- VR5 HD Spatial Channel Emulator
- Genie TS
- TR7600 SII Automated X-Ray Inspection System
- V810 Automated 3-D In-Line X-ray Inspection System
- iDVM iPhone- and iPad-Enabled Wireless Multimeter
- U1230 Series Handheld Digital Multimeters
- U1270 Series Handheld Digital Multimeters
- High-Speed Swept Tunable Laser
- IxLoad Attack
- Mu Studio Performance Suite
- MW8219A PIM Master
- ONT-600 Multi-Port Test Module
- TestCenter HyperMetrics mX Ethernet Test Modules
- 190 Series II Four-Channel ScopeMeter
- InfiniiVision 2000 and 3000 X-Series Oscilloscopes
- MDO4000 Mixed Domain Oscilloscope
- N2809A PrecisionProbe Software
- PicoScope 6404 PC Oscilloscope
- PXIe-5186 Digitizer
- WaveRunner HRO 6 Zi
- PVA-3000 PhyView Analyzer
- SSB17 Stressed BERT System
- 2510A Microwave Calibration Standard
- 40-88X Switching and Attenuator Family
- 8990B Peak Power Analyzer
- RPM Real World Performance Measurement Solution
- S-Series SGA RF Signal Generators
- URT-5000 Software Defined RF Player and Signal Generator
- ZT8450 I/Q Digitizer
- AX-Series Semiconductor Test System
- InfinityQuad Multicontact Probe
- T5773 NAND Flash Package Tester
- TS-900 PXI Semiconductor Test System
- Cross Domain Analyzer
- FSW Signal and Spectrum Analyzer
- PXIe-5665 VSA
- VectorStar ME7838A VNA
- WT1800 Precision Power Analyzer
- ZT8650 Vector Signal Analyzer
- 81160A Pulse Function Arbitrary Noise Generator
- M8190 Arbitrary Waveform Generator
- PXDAC4800 Arbitrary Waveform Generator
- 2651A High Power System SourceMeter
- B2900A Series Precision Source-Measure Unit
- PXIe-4141